Measuring and Modeling Anisotropic Reflection
by Greg Ward
A new device for measuring the spatial reflectance distributions
of surfaces is introduced, along with a new
mathematical model of anisotropic reflectance.
The reflectance model presented is both simple and accurate,
permitting efficient reflectance data reduction
The validity of the model is substantiated with comparisons to
complete measurements of surface reflectance functions gathered
with the novel reflectometry device.
This new device uses imaging technology to capture
the entire hemisphere of reflected directions simultaneously,
greatly accelerates the reflectance data gathering process,
making it possible to measure dozens of
surfaces in the time that it used to take to do one.
Example measurements and simulations are shown, and a table of
fitted parameters for several surfaces is presented.
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